AUTh has participated at the IDTEchEx Printed Electronics USA 2018. Prof. S. Logothetidis r. A. Laskarakis presented an oral presentation for the innovations related to SmartLine regarding the the robust, non-destructive, ultra-fast and in-line Precision Metrology (optical, electrical, structural, etc) and the large experimentation data analytics for the quality control of large area printable & flexible & printable OE devices and the ultra-fast digital feedback to the pilot and production lines for the closed loop manufacturing of OE devices with tailored performance and high production yield.

Prof. S. Logothetidis had several discussions with representatives from industrial communities from USA, Canada, Europe and Asia and exchanged views and prospects about the implementation of in-line metrology and control tools for the digital nanomanufacturing of advanced products based on Organic Electronics. These discussions will benefit the SmartLine project since they create new links for the industrial adoption of the project results to different materials for manufacturing of mass-market products. Also, the innovations of the project were demonstrated by an exhibition booth at this event.