Smartline Project together with NANOTEXNOLOGY Organizing Committee organizes the Workshop on In-line & Real-time Metrology and Quality Control for Nano-Manufacturing, during NANOTEXNOLOGY 2019. The objective of the Workshop is the reveal the huge potentiality of in-line and real-time metrology methods (tools, measurement/analysis methodologies, protocols, integration concepts) to revolutionize the digital manufacturing of advanced materials, devices, components, processes and products based on Organic & Printed Electronics.
The Workshop topics include:
- In-line/In-situ/Real-Time characterization tools and methodologies
- Non-destructive metrology methods and tools
- Novel Instruments and Improvements
- Optical, Electrical, Structural, Visual characterization
- Characterization protocols and standards
- Modeling and analysis approaches
- Integration concepts in pilot and production lines
- Defect inspection from nano- to macro-
- Thin film monitoring and optimization of processes
- Feedback, Quality Control and Automation
- In-line Process in Roll-to-Roll, Vacuum and Gas Transport
- Manufacturing & Applications
Workshop International Organizing Committee (tentative, tbc)
S. Logothetidis, Nanotechnology Lab LTFN, AUTh, Greece
N. Li Pira, Centro Richerche FIAT, FCA Group, Italy
M. Klein, Suragus, Germany
E. Malguth, Laytec, Germany
T. Burke, IBS, The Netherlands
G. Winroth, European Commission, Belgium
You can find more information here.
